MIC Sapphire
Home
Contact us
Products
About Us
Factory Tour
Sapphire Data
Contact Us
Sapphire Crystal
Sapphire ingot and wafer
Hperhemisphere sapphire dome
Sapphire dome
Sapphire asperic dome
Special shaped sapphire dome
Sapphire window
Sapphire lens&prism
Sapphire tube&rod
Sapphire hole
Sapphire coating
Special gem components
Other material
Dimensional range, limit deviation (mm)
Item
Radius of curvature(SR)
Caliber(D)
Wall thickness(T)
Dome height(H)
Dimension range
10 ~ ∞
φ20 ~φ400
≥ 1
≤SR2
Technical criteria
Item
Average
Precise
Ultraprecise
Facial contour (632.8nm) N
5λ
2/5λ
λ
Irregularity degree △N
1
1/2
1/4
Surface quality MIL
80/50
60/40
40/20
Surface roughness(nm)
1.5~2.5
0.5~1.5
< 0.5
Edge thickness difference
0.05
0.02
0.01
Wall thickness uniformity
0.10
0.05
0.02
C axis deviation
≤5°
≤2°
≤0.5°
Center deviation X
5′~ 2
2′~ 1
≤ 1′
Crystal orientation
C、A、M optional
Transmittance
Under 632.8nm wavelength>85%
About Us
|
Products
|
Contact Us
Copyright © All rights reserved. 1999-2016 Chongqing MIC Technology Co., Ltd, China